{"product_id":"semilab-cms-3-resistance-measurement","title":"Semilab CMS-3 Non-Contact Sheet Resistance Measuring System","description":"\u003cp\u003eThe \u003cstrong\u003eSemilab CMS-3\u003c\/strong\u003e is a cutting-edge non-contact sheet resistance measuring system, designed for precise material characterization and analysis. This advanced system, manufactured by \u003cstrong\u003eSemilab\u003c\/strong\u003e, is essential for research laboratories, semiconductor fabrication, and materials science applications, ensuring accurate and reliable measurements for process optimization.\u003c\/p\u003e\n\n\u003cp\u003eThe \u003cstrong\u003eSemilab CMS-3\u003c\/strong\u003e utilizes junction photovoltage (JPV) technology to analyze \u003cstrong\u003enp or pn junctions\u003c\/strong\u003e within samples ranging from 100 to 156 mm. Its non-destructive testing capabilities, coupled with a measurement range of 10 Ω\/sq. to 200 Ω\/sq., make it a versatile tool. The system's probe height above transport belt is 1.5 mm, ensuring precision. This system is perfect for those seeking accuracy and efficiency in material analysis.\u003c\/p\u003e\n\n\u003cp\u003eKey Features:\u003c\/p\u003e\n\u003cul\u003e\n \u003cli\u003e\n\u003cstrong\u003eNon-Contact Measurement\u003c\/strong\u003e: Enables non-destructive testing for sample integrity.\u003c\/li\u003e\n \u003cli\u003e\n\u003cstrong\u003eWide Measurement Range\u003c\/strong\u003e: Measures sheet resistance from 10 Ω\/sq. to 200 Ω\/sq.\u003c\/li\u003e\n \u003cli\u003e\n\u003cstrong\u003eVersatile Applications\u003c\/strong\u003e: Ideal for semiconductor manufacturing, nanotechnology research, and advanced materials analysis.\u003c\/li\u003e\n \u003cli\u003e\n\u003cstrong\u003eAdvanced Technology\u003c\/strong\u003e: Utilizes junction photovoltage (JPV) for precise analysis.\u003c\/li\u003e\n \u003cli\u003e\n\u003cstrong\u003eUser-Friendly Interface\u003c\/strong\u003e: Equipped with software for easy data acquisition and analysis.\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003cp\u003eSpecifications:\u003c\/p\u003e\n\u003cul\u003e\n \u003cli\u003eSample Size: 100 to 156 mm\u003c\/li\u003e\n \u003cli\u003eSample Structure: np or pn junctions\u003c\/li\u003e\n \u003cli\u003eMeasurement Range: 10 Ω\/sq. to 200 Ω\/sq.\u003c\/li\u003e\n \u003cli\u003eProbe Distance: 1.5 mm probe height above transport belt\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003cp\u003eThe \u003cstrong\u003eSemilab CMS-3\u003c\/strong\u003e offers exceptional performance and reliability for your material characterization needs. Trust in the \u003cstrong\u003eSemilab\u003c\/strong\u003e brand for quality and precision in your industrial or automation systems. For further assistance, contact us at \u003ca href=\"mailto:info@ramautomations.com\"\u003einfo@ramautomations.com\u003c\/a\u003e.\u003c\/p\u003e","brand":"Semilab","offers":[{"title":"Default Title","offer_id":50079972458838,"sku":"RAMA989896","price":999.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0818\/5554\/5686\/files\/ram-automations_6d116a74-7fc0-4185-9056-adbb5aca3af2.webp?v=1742535160","url":"https:\/\/ramautomations.com\/products\/semilab-cms-3-resistance-measurement","provider":"Ram Automations","version":"1.0","type":"link"}