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Semilab Non Contact Sheet Resistance Measuring System type CMS-3. Measuring technique: non-contact, junction photovoltage (JPV). Sample size: 100 to 156 mm. Sample structure: np or pn junctions. Measurement range: 10 Ω/sq. to 200 Ω/sq....
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Semilab Non Contact Sheet Resistance Measuring System type CMS-3. Measuring technique: non-contact, junction photovoltage (JPV). Sample size: 100 to 156 mm. Sample structure: np or pn junctions. Measurement range: 10 Ω/sq. to 200 Ω/sq. Probe distance: 1.5 mm probe height above transport belt.
The Semilab CMS-3 is a highly advanced measurement system designed for precise characterization of semiconductor materials and thin films. Manufactured by Semilab, a leading provider of metrology solutions, this system is widely used in research laboratories, semiconductor fabrication, and materials science applications. The CMS-3 is engineered to deliver accurate and reliable measurements, making it an essential tool for quality control and process optimization in the semiconductor industry.
Equipped with cutting-edge measurement technology, the Semilab CMS-3 provides high-resolution analysis of material properties such as thickness, optical constants, and electrical characteristics. Its advanced capabilities enable precise data collection for evaluating thin film uniformity, doping concentration, and surface properties. The system is designed for non-destructive testing, allowing users to conduct in-depth material analysis without compromising sample integrity.
The Semilab CMS-3 features a user-friendly interface and flexible software that supports a wide range of measurement configurations. Its robust construction ensures long-term stability and accuracy, making it suitable for both research and industrial applications. With automated data acquisition and analysis, the system enhances productivity and simplifies complex measurement tasks, providing consistent and reproducible results.
Ideal for semiconductor manufacturing, nanotechnology research, and advanced materials analysis, the Semilab CMS-3 offers exceptional performance, precision, and versatility. Its ability to deliver high-quality measurement results, combined with its reliable operation and advanced analytical features, makes it a critical tool for scientists and engineers working in semiconductor and material characterization fields.
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